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| 1. |
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Reliability and Failure Analysis of High-Power LED Packaging
Cher Ming Tan, Preetpal Singh
E-bok. Elsevier Science, USA, 2022.
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| 2. |
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Reliability and Failure Analysis of High-Power LED Packaging
Cher Ming Tan
Häftad. Woodhead Publishing, USA, 2022.
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| 3. |
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Inbunden. Springer London Ltd, 2011.
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| 4. |
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
E-bok. Springer London, 2011.
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| 5. |
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Graphene and VLSI Interconnects
Cher-Ming Tan, Udit Narula, Vivek Sangwan
E-bok. Jenny Stanford Publishing, 2021.
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| 6. |
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Graphene and VLSI Interconnects
Cher-Ming Tan, Udit Narula, Vivek Sangwan
E-bok. Jenny Stanford Publishing, 2021.
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| 7. |
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Häftad. Springer London Ltd, 2013.
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| 8. |
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Simulated Annealing
Cher Ming Tan
Inbunden. In Tech, Kroatien, 2008.
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| 9. |
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Future Learning in Primary Schools
Ching Sing Chai, Cher Ping Lim, Chun Ming Tan
Häftad. Springer Verlag, Singapore, Singapore, 2016.
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| 10. |
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Theory and Practice of Quality and Reliability Engineering in Asia Industry
Cher Ming Tan, Thong Ngee Goh
Inbunden. Springer Verlag, Singapore, Singapore, 2017.
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| 11. |
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Theory and Practice of Quality and Reliability Engineering in Asia Industry
Cher Ming Tan, Thong Ngee Goh
E-bok. Springer Nature Singapore, Singapore, 2017.
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| 12. |
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Theory and Practice of Quality and Reliability Engineering in Asia Industry
Cher Ming Tan, Thong Ngee Goh
Häftad. Springer Verlag, Singapore, Singapore, 2018.
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| 13. |
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Future Learning in Primary Schools
Ching Sing Chai, Cher Ping Lim, Chun Ming Tan
Inbunden. Springer Verlag, Singapore, Singapore, 2015.
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| 14. |
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Future Learning in Primary Schools
Ching Sing Chai, Cher Ping Lim, Chun Ming Tan
E-bok. Springer Nature Singapore, Singapore, 2015.
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| 15. |
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Electromigration In Ulsi Interconnections
Cher Ming Tan
Inbunden. World Scientific Publishing Co Pte Ltd, Singapore, 2010.
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| 16. |
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Electromigration Modeling at Circuit Layout Level
Cher Ming Tan, Feifei He
Häftad. Springer Verlag, Singapore, Singapore, 2013.
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| 17. |
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Electromigration Modeling at Circuit Layout Level
Cher Ming Tan, Feifei He
E-bok. Springer Nature Singapore, Singapore, 2013.
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| 18. |
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Electromigration In Ulsi Interconnections
Tan Cher Ming Tan
E-bok. World Scientific Publishing Company, Singapore, 2010.
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| 19. |
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Graphene and VLSI Interconnects
Cher-Ming Tan, Udit Narula, Vivek Sangwan
Inbunden. Jenny Stanford Publishing, Singapore, 2021.
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